Paper Details

Characterization techniques are crucial for comprehensively understanding the unique properties of nanomaterials, which often exhibit distinct behaviors at the nanoscale. Transmission Electron Microscopy (TEM) allows direct visualization of nanomaterials' morphology, structure, and crystallinity at atomic resolution, providing insights into their fundamental properties. Scanning Electron Microscopy (SEM) complements TEM by offering high-resolution surface imaging, facilitating the observation of surface features and morphological characteristics of nanomaterials. Atomic Force Microscopy (AFM) enables nanoscale topographical imaging and mechanical property measurements, providing valuable information on surface roughness, adhesion, and elasticity. X-ray Diffraction (XRD) elucidates the crystallographic structure, phase purity, and lattice parameters of nanomaterials, aiding in their structural characterization and phase analysis. Dynamic Light Scattering (DLS) is utilized for size distribution analysis of nanoparticles in solution, providing information on particle size, polydispersity, and colloidal stability. Fourier Transform Infrared Spectroscopy (FTIR) and Raman spectroscopy offer insights into the chemical composition, functional groups, and molecular vibrations of nanomaterials, facilitating their chemical characterization and surface analysis. Collectively, these characterization techniques empower researchers to probe the structural, morphological, chemical, and physical properties of nanomaterials, enabling advancements in various fields such as materials science, nanotechnology, biomedical engineering, and environmental science. The synergy between these techniques enhances our understanding of nanomaterials and drives innovation in their synthesis, design, and application for diverse technological solutions.

SEM, TEM, nanomaterials, AFM, FTIR.